The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 11, 1995

Filed:

May. 29, 1992
Applicant:
Inventors:

Gregory E Johnston, Redondo Beach, CA (US);

Robert E Malm, Pacific Palisades, CA (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N / ;
U.S. Cl.
CPC ...
358474 ; 358487 ;
Abstract

The high-resolution scanning apparatus utilizes conventional transport mechanisms in combination with a precision interferometric distance-measuring apparatus to achieve extremely-precise measurements of pixel locations thereby permitting scanning resolutions exceeding 10,000 dpi to be achieved. The high-resolution scanning apparatus is comprised of the conventional elements of a scanner together with one or more precision interferometric distance-measuring devices for the purpose of establishing the precise location of the pixel being measured. With this approach the mechanical limitations of the transport mechanisms that cause the optical system to scan the image-containing medium do not limit the resolution achievable with the scanning apparatus. The invention also provides compensating unit for variations in the object distance to the lens introduced by imperfections in the transport mechanisms. The light detectors are mounted on a platform that can be moved either nearer to or farther from the lens in accordance with changes in the object distance as measured by a precision interferometric distance-measuring device.


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