The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 11, 1995

Filed:

Jan. 05, 1994
Applicant:
Inventors:

Masami Sugiyama, Toyonaka, JP;

Takao Sakai, Habikino, JP;

Assignee:

Minolta Co., Ltd., Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J / ;
U.S. Cl.
CPC ...
356405 ; 356418 ; 356419 ;
Abstract

A two-dimensional colorimeter focuses light through a beam splitter onto a rotary filter so that a first light receiving element can receive light from multiple points on a sample. A rotating filter can provide multiple measurements based upon different wavelengths of light. A portion of the light from the beam splitter also contacts a spectral sensor which separates the light from a particular point into primary wavelength elements which are converted into electrical signals. Based upon these primary wavelength elements, the first signals from the light receiving element are corrected. As a result, the measurement of chromaticity of multiple points on a sample can be performed accurately using a device of simple construction.


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