The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 11, 1995

Filed:

Jan. 03, 1994
Applicant:
Inventors:

Edwin Flecha, Boca Raton, FL (US);

Kelvin D Henry, Boca Raton, FL (US);

James C Mahlbacher, Lake Worth, FL (US);

Michael Servedio, Boca Raton, FL (US);

Kenneth S Weinaug, Lilburn, GA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324754 ; 324537 ; 324679 ; 324705 ; 324718 ;
Abstract

A method and apparatus for testing circuit boards uses a pair of probes to contact the various nodes on the circuit board. A single one of the pair of probes may be used to deposit a charge at a being tested net and checking for the presence of a charge at subsequent nets to determine whether a short condition exists. Moreover, the pair of probes is used to contact two nodes of a network being tested to measure the resistance within the network being tested; the measured resistance being compared to a nominal resistance, to determine whether an open condition exists. In addition, the pair of probes may be used to measure the resistance between networks in order to verify or determine whether a short condition exists between networks.


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