The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 11, 1995
Filed:
Nov. 04, 1993
Applicant:
Inventor:
Willem M Coene, Eindhoven, NL;
Assignee:
U.S. Philips Corporation, New York, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J / ;
U.S. Cl.
CPC ...
250307 ; 250311 ;
Abstract
A method for image reconstruction in a high-resolution electron microscope. The Fourier transform (29) of an electron hologram (28) is obtained which is composed of a central frequency domain CB=I.sub.hol,0 (G) and two sidebands SB+=I.sub.hol,+ (G) and SB-=I.sub.hol,- (G). The two sidebands represent the linear image information. By making use of the frequencies in the central frequency domain in the image reconstruction, a non-linear image reconstruction is performed having a resolution which is considerably higher than the achievable information limit in linear image reconstruction using only the sidebands.