The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 11, 1995
Filed:
Nov. 04, 1992
Mathias Fink, Meudon, FR;
Universite Paris VII, Paris, FR;
Abstract
A method for internal inspection of pieces having an interface with a propagation medium, is described. The steps include: illuminating a reference piece with an ultrasound beam from a first array of transducers excited by stored excitation signals; sensing reflected echo signals received by transducers, which may be the transducers of the first array, and storing the waveforms and time distribution thereof; simultaneously sensing refracted signals, received by transducers belonging to a second array placed opposite to the the first relative to the piece and storing the waveforms and time distribution of the signals received by the transducers of the second array; replacing the reference piece with a piece to be inspected having the same shape and occupying the same location, and applying, to each of the transducers, energization signals obtained by time reversal of the stored waveforms and time distribution; and sensing the signals received by the transducers of the second network.