The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 04, 1995

Filed:

Oct. 10, 1989
Applicant:
Inventors:

Wilhelm A Sauerwald, Eindhoven, NL;

Franciscus G De Jong, Eindhoven, NL;

Assignee:

U.S. Philips Corporation, New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
371 223 ; 371 225 ;
Abstract

A method for testing integrated circuits provided on a carrier. The circuits include a series input (22) and a series output (24) for test and result patterns. A mode control register (30) receives a mode control signal train via the serial input. Under the control of said mode control signal train the serial input and output can be shortcircuited to each other, or further registers (32, 34, 36) can be selectively filled and emptied. In this manner, both the interior of the integrated circuit and respective interconnection functions can easily be tested by a universal protocol. Integrated circuits and the carrier only require minor extension/adaptations.


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