The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 04, 1995
Filed:
Feb. 25, 1994
Charles M Hammond, Jr, Skaneateles, NY (US);
William H Havens, Skaneateles, NY (US);
Andrew Longacre, Jr, Skaneateles, NY (US);
Welch Allyn, Inc., Skaneateles Falls, NY (US);
Abstract
There is provided a system of detecting mark-sense indicia wherein the images of a light source and the region of sensitivity of a light sensor are substantially coaxial, coplanar, and coextensive throughout the working depth of field. This system is insensitive to the laminate and the diffusion effects. A light source is aimed at a beam splitter that diverts a portion of the light beam through optics that focus the light on a reflective target containing a bar code symbol to be scanned. The reflected beam is returned through the optics and the beam splitter, and a portion of the reflected beam is conducted to a light sensor. In this manner, the light path from the detector to the optical sensor is split twice by the beam splitter. The optics are configured so that the light beams that define the field of illumination and the region of sensitivity and which pass between the optics and the target are congruent, having identical optical axes and angles of divergence.