The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 04, 1995

Filed:

Sep. 28, 1993
Applicant:
Inventors:

Sang H Woo, Kyoungki-do, KR;

Ha E Jeon, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L / ;
U.S. Cl.
CPC ...
437 40 ; 437247 ; 437967 ; 148D / ; 148D / ;
Abstract

A method for manufacturing a TFT of a SRAM in a highly-integrated semiconductor device, to enlarge the grain size of a polysilicon film, includes steps of depositing amorphous silicon film under a pressure capable of maintaining a uniform thickness thereof, and forming a polysilicon film which has a maximized grain size in the same tube that the amorphous silicon film has been deposited, while performing an annealing process by raising the temperature to 600.degree.-650.degree. C. for 4-10 hours under the pressure which is lowered to approximately 10.sup.-3 Torr. The polysilicon film having a maximized grain size is utilized as the channels of the TFT.


Find Patent Forward Citations

Woo, Sang. (1995). Method for manufacturing a thin film transistor (U.S. Patent No. 5429961). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5429961

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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