The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 04, 1995

Filed:

Oct. 26, 1992
Applicant:
Inventors:

Martin Vanderlaan, Danville, CA (US);

Larry H Stanker, Livermore, CA (US);

Bruce E Watkins, Livermore, CA (US);

Peter Petrovic, Hochheim am Main, DE;

Siegbert Gorbach, Eppstein/Ts., DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ; G01N / ; G01N / ;
U.S. Cl.
CPC ...
435-71 ; 435-79 ; 435-792 ; 435803 ; 435961 ; 435962 ; 435-75 ; 436523 ; 436531 ; 436825 ; 436815 ; 436161 ;
Abstract

A method is described for the use of monoclonal antibodies in a sensitive immunoassay for halogenated dioxins and dibenzofurans in industrial samples which contain impurities. Appropriate sample preparation and selective enzyme amplification of the immunoassay sensitivity permits detection of dioxin contaminants in industrial or environmental samples at concentrations in the range of a few parts per trillion.


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Vanderlaan, Martin. (1995). Method for immunodiagnostic detection of dioxins at low concentrations (U.S. Patent No. 5429925). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5429925

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