The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 27, 1995
Filed:
Mar. 05, 1993
Applicant:
Inventors:
John R Kuban, Heath, TX (US);
Robert D Maher, III, Carrollton, TX (US);
Assignee:
Cyrix Corporation, Richardson, TX (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ; G06F / ;
U.S. Cl.
CPC ...
371 223 ; 371 221 ; 371 224 ; 324 731 ;
Abstract
A scan test architecture includes first and second serial scan paths for transferring test data to and from an integrated circuit's logic. A first clock controls transfer of information on the first scan path and a second clock controls transfer of data on the second scan path. The first and second clocks are alternately enabled by a control signal initiated under program control of the external test system.