The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 27, 1995
Filed:
Dec. 17, 1993
Jerry E Cahill, Trumbull, CT (US);
Alan M Ganz, Trumbull, CT (US);
Paul Saviano, Norwalk, CT (US);
David Tracy, Norwalk, CT (US);
Yongdong Wang, Norwalk, CT (US);
The Perkin-Elmer Corporation, Norwalk, CT (US);
Abstract
A method and apparatus are provided for correction of spectra for stray radiation in a spectrometric instrument, involving a sequence of steps as follows. Spectral patterns are obtained with the instrument initially for monochromatic radiation at a plurality of selected calibration wavelengths. By computer program, the peak profile at the calibration wavelength in each pattern is replaced with a substitute based on the remaining pattern. The resulting data are interpolated to effect values denoted 'stray proportions' for the ordered wavelengths of the instrument. Spectral data at each ordered wavelength are obtained with the instrument for a sample, and multiplied in the computer program by stray proportions for corresponding wavelengths to effect further sets of values denoted 'stray portions' that are identified to the ordered wavelengths. Each set is identified to one of the wavelength increments of the instrument across the spectral range. In each set, the stray portions for the ordered wavelengths are summed. The total for each wavelength increment is subtracted from the original sample data for the increment to effect spectral data corrected for stray.