The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 27, 1995
Filed:
Jan. 31, 1994
Applicant:
Inventor:
Thomas J Grycewicz, Belmont, MA (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356430 ;
Abstract
The rapidly moving uniform surface being inspected is illuminated with either laser or wide-band light. The Fourier transform of the surface is produced upon the detector plane of an electronic camera. In the absence of defects, the transform light energy is produced only in the center of the detector plane but in the presence of defects light is produced in various non-centralized portions of the detector plane which can indicate the orientation and size of the defect.
Grycewicz, Thomas. (1995). Optical fourier transform method for detecting irregularities upon (U.S. Patent No. 5428452). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5428452
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