The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 27, 1995

Filed:

Dec. 13, 1993
Applicant:
Inventors:

Richard D Daugherty, Hanover, IN (US);

Roland L Halm, Madison, IN (US);

Charles S Kuivila, Crestwood, KY (US);

Assignee:

Dow Corning Corporation, Midland, MI (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C01B / ;
U.S. Cl.
CPC ...
436 72 ; 436 75 ; 436 79 ; 436 80 ; 420578 ; 423348 ;
Abstract

The present invention is a method for analyzing silicon for nonmetallic contaminants. The method comprises: (A) forming an alloy comprising silicon and a metal which promotes separation of nonmetallic contaminants present in the alloy, (B) separating the nonmetallic contaminants from the alloy, and (C) analyzing the separated nonmetallic contaminants for chemical content. The present invention is particularly useful for analyzing metallurgical grade silicon intended for use in the direct process for the production of organohalosilanes for the presence of oxides and carbides of calcium, aluminum, and silicon.


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