The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 27, 1995
Filed:
Apr. 19, 1993
Russell S Shelton, Flanders, NJ (US);
Advanced Metrological Development, Flanders, NJ (US);
Abstract
Accurate measurements of production parts are obtained from a system which includes a first measuring apparatus in a laboratory, and a second measuring apparatus which is in a non-laboratory environment where it is subjected to greater temperature fluctuations than in the laboratory. A reference part of substantially the same size and shape as the production parts is inspected by both measuring apparatuses, and the production part is inspected by the second measuring apparatus. While being inspected, both parts occupy substantially the same location on the second measuring apparatus. Results of these inspections are processed by a computer to provide (1) target values which the shop machine would perceive when inspecting a perfect part as specified by the part drawings, or (2) values which indicate what the laboratory machine would perceive for the production part.