The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 20, 1995
Filed:
Jun. 11, 1993
Toshio Hamada, Nagoya, JP;
Taizo Umezaki, Kasugai, JP;
Chuo Hatsujo Kabushiki Kaisha, Aichi, JP;
Abstract
In a fingerprint scanning device for use in identification, a fingerprint image input device is provided to photoelectronically input a specified fingerprint of an entrant. A monochrome image data of the ridge pattern of the entrant fingerprint is stored as fingerprint image data. A feature extraction device has a calculator which treats the ridge pattern image with one-dimensional group-delay spectrum transform in X- and Y-directions. The feature extraction device has the characteristic of isolating and emphasizing peaks of the individual frequency spectra in the form of differential with respect to a phase component frequency in Fourier transform analysis, and determining group-delay spectra in X- and Y-direction respectively as fingerprint feature portions. A distinction device is provided to collate the entrant feature portion with a registrant feature portion which is registered by the fingerprint image input means so as to identify the entrant with the registrant when X-oriented and Y-oriented group-delay spectra are recognized as being the same between the entrant and the registrant by calculating whether Euclidean distances fall short of a predetermined threshold limit upon collating the individual ridge pattern image.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile