The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 20, 1995
Filed:
Jul. 16, 1993
James H Terhune, San Jose, CA (US);
David L Faulstich, San Jose, CA (US);
General Electric Company, San Jose, CA (US);
Abstract
A method for ultrasonically inspecting a closely packed regular array of mutually parallel, uniformly sized and spaced rigid rods surrounded by a thin-walled metallic channel and immersed in a compressible medium. The method utilizes the properties of coherently scattered ultrasonic waves to identify rods which are defective, out of position or missing. A plane, monochromatic ultrasonic wave is transmitted toward the array of rods on one side thereof. Then an interference pattern produced on an opposing side of the array is detected. This interference pattern is the result of multiple scattering and diffraction of the plane ultrasonic wave during propagation through the array of rods. When the wavelength is comparable with the rod diameter and the rods are not too close together, scattering results in spatial relationships that produce an unusually large amount of wave penetration through the array in certain directions relative to the incident propagation vector. This is akin to Bragg scattering and is dependent on direction, wavelength, and details of the cylindrical array dimensions.