The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 20, 1995
Filed:
Oct. 26, 1993
Welles Reymond, Waterbury, CT (US);
General DataComm, Inc., Middlebury, CT (US);
Abstract
A connector system having an electrical switch capability for connecting a first electrical conductor to a second electrical conductor is provided and includes a spring biased contact element having a first portion for making electrical contact with the first electrical conductor, a second tapered contact portion for mating with a conductive rim of a hole of the second conductor, and a spring portion for biasing the tapered contact portion in the closed position where the second tapered contact portion mates with the conductive rim, and an actuation member for bringing the tapered contact portion into the open position. The actuation member may be a plunger or the like which enters the hole with which the tapered contact portion is mated from the rear side and pushes the tapered contact portion out of contact. The actuation member may have its own electrical characteristics for test purposes, and may be insulated just for opening the circuit, or appropriately insulating and conductive to form a new circuit path. The actuation member may make electrical contact with either the tapered contact portion or the conductive rim either before or after the connection between the tapered contact and the conductive rim is broken. The connector system typically connects several first conductors with several respective second conductors and allows selective switching/testing of one or more individual connections without disturbing the other connections.