The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 20, 1995
Filed:
Oct. 26, 1993
Applicant:
Inventors:
Martin M Gram, St. Louis Park, MN (US);
Carl G Larsen, Minneapolis, MN (US);
Han-sheng Chen, Eden Prairie, MN (US);
F Joseph Albright, Minnetonka, MN (US);
Assignee:
MTS Systems Corporation, Eden Prairie, MN (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73816 ; 73856 ; 73860 ; 73781 ;
Abstract
A material test system capable of applying multiple force load components simultaneously includes a first actuator connected in parallel with a spring element. The first actuator and the spring element in turn are connected in series with the test specimen and a second actuator. The spring element is substantially rigid in order to transfer the force load from the second actuator to the test specimen yet substantially compliant in order to allow transfer of the force load from the first actuator to the test specimen.