The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 13, 1995

Filed:

Jun. 18, 1993
Applicant:
Inventors:

Jun Akedo, Tsukuba, JP;

Yuichi Okazaki, Tsukuba, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ; G01B / ;
U.S. Cl.
CPC ...
356371 ; 356360 ; 356366 ; 356127 ; 359 19 ;
Abstract

An optical displacement sensor that has a light beam polariscope located on the light path of light reflected from a target surface, and means for detecting the focal point position and transverse position of the light beam from the polariscope. The focal point position corresponds to axial displacement at the target surface, and the transverse position corresponds to inclination of the target surface, so the effect of the inclination of the surface can be compensated for by using a transverse position detection signal to adjust the light beam polariscope.


Find Patent Forward Citations

Akedo, Jun. (1995). Optical displacement sensor for measurement of shape and coarseness of a (U.S. Patent No. 5424834). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5424834

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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