The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 13, 1995

Filed:

Jul. 30, 1993
Applicant:
Inventor:

Terrance R Kinney, South Bend, IN (US);

Assignee:

Control Development, Inc., South Bend, IN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J / ; G01J / ;
U.S. Cl.
CPC ...
356326 ; 356328 ;
Abstract

A wideband optical micro-spectrometer system for detecting the intensity of light as a function of wavelength. The device employs multiple optical micro-spectrometers generating adjacent spectra mounted onto a single photodetector array and digital processing techniques to generate a continuous wide spectrum from the narrower spectrums generated by the optical micro-spectrometers. Optical micro-spectrometers generating non-adjacent spectra could also be employed to produce spectral data for predetermined non-adjacent spectral ranges. System reliability is improved and maintenance reduced with the use of pre-aligned optical micro-spectrometers. Thereby, a device is created which has the spectral range of larger spectrometers having a much reduced physical size, increased system reliability and reduced maintenance requirements.


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