The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 13, 1995
Filed:
Mar. 29, 1994
Boehringer Mannheim GmbH, Mannheim, DE;
Abstract
Test strip analysis system includes an analysis apparatus with a test strip holding device (3) and matching test strips. The test strip holding device (3) serves to position the test strip (4) in a defined position relative to a measuring unit (11). It includes a test strip seating device (20) and a guide for the test strip. Exact positioning with simple handling and without sophisticated mechanical elements is achieved by the fact that at least one part of the test strip seating device (20), in the area in which, in the measuring position, the front section (12) of the test strip is located, is formed as a support (24) which is offset in height relative to the middle plane (22) of the test field area (13). The test strip holding device (3) includes a pressure element (33) which, in the measuring position presses between the support (24) and the test field area (13) of the test strip (4) against the side (34) opposite the seating device ( 20) of the latter. The test strip (4) is consequently subjected to bending stress, whereby the particular distance of the at least one test field (6) from the measuring unit (11) is ensured.