The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 06, 1995

Filed:

Feb. 22, 1994
Applicant:
Inventors:

Akihiro Shiratori, Kanagawa, JP;

Junichiroh Ohyama, Kanagawa, JP;

Shingo Murayama, Kanagawa, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
371 61 ;
Abstract

Disclosed is a timing check circuit comprising a signal change detector, connected to a first input terminal, a decision window generator for receiving the output of the signal change detector, a decision condition detector, connected to a second input terminal, and an AND gate for obtaining a logical product of the output of the decision window generator and the output of the decision condition detector. The output of this AND gate is connected to a clock input terminal of a flip-flop of a logic cell in a specific system. When there is an output from the AND gate, it is determined that an error has occurred. With this structure, a timing check system designed on the premise that logic cells in a specific system are used can execute timing check for a functional macro constituted of a combination of logic cells in the specific system.


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Shiratori, Akihiro. (1995). Timing check circuit for a functional macro (U.S. Patent No. 5422896). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5422896

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