The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 06, 1995

Filed:

Nov. 19, 1991
Applicant:
Inventors:

Benny J Klingsporn, Spring, TX (US);

Steven E Fairchild, Houston, TX (US);

Mark T Lundgreen, Cypress, TX (US);

Michael R Geroche, Tomball, TX (US);

Assignee:

Compaq Computer Corporation, Houston, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C / ;
U.S. Cl.
CPC ...
371 216 ; 371-51 ;
Abstract

A dynamic testing method for determining disk drive error rates based on the number of bytes which are read from a hard disk drive during test. The method identifies specific faulting disk sectors and disk error types and maintains a log of the errors. The method also accumulates the total number of bytes which have been read from the disk and determines whether the disk under test has exceeded acceptable error rates based on the number of bytes read during the test. This permits the method to identify a disk drive as having failed its test prior to completion of the full disk drive test cycle.


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