The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 06, 1995

Filed:

Apr. 11, 1994
Applicant:
Inventor:

Robert E Ryan, Levittown, NY (US);

Assignee:

Northrop Grumman Corporation, Los Angeles, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356345 ; 356346 ;
Abstract

A Fourier-transform spectrometer includes a plurality of detectors (118-1 through 118-L), each of which receives light from a pair of optical paths of different optical path lengths. A movable mirror (116) varies the difference between the path lengths of each pair. Analog-to-digital converters (124-1 through 124-L) sample the resultant outputs at regular distance-difference intervals so as to generate sequences of sample values. The distance-difference ranges for the pairs of paths associated with different detectors are different, and the sequences together make up a synthetic interferogram that covers a range of distance differences 2L times the range of motion of the movable mirror (116). A Fourier transformation circuit (126) computes the Fourier transform of the synthetic interferogram, thereby determining the power spectrum of the incoming light, and operates a display (128) to indicate the result.


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