The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 06, 1995
Filed:
Mar. 30, 1993
Mitsuru Ichinomiya, Yokohama, JP;
Kimio Tanaka, Yokohama, JP;
Toshinori Higaki, Yokohama, JP;
Shigeru Oshima, Yokohama, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
An aperture device for use in an optical apparatus has a plurality of aperture blades which cooperate in collectively defining an aperture of a desired size. The inner edge of at least one of such blades defining one side of the aperture is uneven over at least part of the length of the inner edge. The spacing between adjacent relatively high portions and relatively low portions, as well as the depth, is smaller than the exposed length of the inner edge of each aperture blade when the aperture device has been operated to the minimum aperture size. Preferably, the spacing between adjacent crests or between adjacent high portions and low portions of the unevenness varies in a non-periodic manner.