The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 30, 1995

Filed:

Oct. 14, 1992
Applicant:
Inventors:

Tamami Sugasaka, Komae, JP;

Kazushige Saga, Asakusabashi, JP;

Minoru Sekiguchi, Machida, JP;

Shigemi Nagata, Yokohama, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
395 23 ; 364148 ; 395 22 ; 395 81 ;
Abstract

This invention pertains to neural network system for learning an external evaluation standard and for learning the evaluation from the outside for the processing result, in a system capable of internal evaluation of the correspondence between external information and the processing result of its own system for the input information. It purports to learn the external evaluation as the internal evaluation standard of the internal evaluation time. The learning system comprises an internal evaluation unit for evaluating an evaluation input pattern including input information at a first point in time and input information inputted at a point in time for the processing result of its own system for the input information according to the internal evaluation standard at a system execution time; and an evaluation desired pattern memory unit for making the external evaluation correspond with the evaluation input pattern and for memorizing it as an evaluation desired pattern for having the internal evaluation unit learn the external evaluation standard. The system is configured to have an internal evaluation unit to learn the evaluation desired pattern at a learning time of the system. This system is applicable in a robot control system.


Find Patent Forward Citations

Loading…