The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 30, 1995

Filed:

Jan. 12, 1994
Applicant:
Inventor:

Dan Slater, La Habra Heights, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356355 ; 356359 ; 356360 ; 356363 ;
Abstract

A three-axis motion tracking interferometer for use with an article under test (AUT) is provided for measurement and correction of position errors between the AUT and a near-field probing sensor due to thermal drift. The probing sensor is positioned at a plurality of points relative to the AUT to perform a phase front measurement of the AUT. Periodically, the probing sensor is positioned at a subset of the plurality of points, the subset being sufficient to define a geometric surface, such as a plane, cylinder, or sphere. A distance change measurement is performed between the AUT and the probing sensor at each of the subset of points, and three-axis components of relative motion between the AUT and the probing sensor are calculated based upon the distance change measurement. The phase front measurement of the AUT can then be corrected based upon the three-axis components.


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