The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 30, 1995
Filed:
Mar. 10, 1993
Hiromi Ogi, Tokyo, JP;
Hideo Tanaka, Tokyo, JP;
Yoshiakira Akimoto, Tokyo, JP;
Yoshio Izui, Hyogo, JP;
Mitsubishi Denki Kabushiki Kaisha, Tokyo, JP;
Abstract
A monitoring diagnostic apparatus for detecting an abnormality occurring in an object being monitored such as electrical equipment and determining the cause of the abnormality is disclosed. First of all, vibration or partial discharge occurring in the monitored object is detected by using a sensor installed in close proximity to the monitored object. A detection signal output by the sensor then undergoes predetermined signal processing such as the Fourier transform and normalization. After the predetermined signal processing is completed, a neural network identifies the abnormality occurring in the monitored object and determining the cause of the abnormality. The neural network carries out a learning process based on causes of abnormalities occurring in the monitored object, outputting signals corresponding to the causes of the abnormalities.