The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 23, 1995
Filed:
Jan. 12, 1993
Hamid K Aghajan, Stanford, CA (US);
Thomas Kailath, Stanford, CA (US);
Board of Trustees of the Leland Stanford Junior University, Palo Alto, CA (US);
Abstract
A new signal processing method solves the problem of fitting multiple lines in a two-dimensional image. The Subspace-Based Line Detection (SLIDE) algorithm formulates the multi-line fitting problem in a special parameter estimation framework such that a signal structure similar to the sensor array processing signal representation is obtained. Any spectral estimation method can then be exploited to obtain estimates of the line parameters. In particular, subspace-based algorithms of sensor array processing (e.g., the ESPRIT technique) can be used to produce closed-form and high resolution estimates for line parameters. The signal representation employed in this formulation can be generalized to handle both problems of line fitting (in which a set of binary-valued discrete pixels is given) and of straight edge detection (in which one starts with a grey-scale image).