The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 23, 1995

Filed:

Jul. 19, 1993
Applicant:
Inventors:

Rudolph M Snoeren, Eindhoven, NL;

Antonius J Van Bussel, Eindhoven, NL;

Assignee:

U.S. Philips Corporation, New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M / ;
U.S. Cl.
CPC ...
378 983 ; 378 982 ; 378 987 ;
Abstract

An X-ray examination apparatus includes an X-ray source (10) and an image intensifier (30) with an imaging screen (32). The imaging screen (32) is imaged on the pick-up face (51) of an image pick-up device (50), for example a television camera. In order to adjust or maintain the optimum response time of the image pick-up device (50) to or at the desired level, the pick-up face (51) is illuminated by means of a number of illumination elements (145). In order to achieve a compact construction of the apparatus, the illumination elements (145) are accommodated in recesses (144) in a transparent element (141). The light of the illumination elements (145) is then reflected from the entrance face (142) facing the image intensifier (30) and/or from the sides (147) of the element (141). The transparent element (141) may be a prism so that the optical path between the image intensifier (30) and the image pick-up device (50) is folded.


Find Patent Forward Citations

Loading…