The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 23, 1995
Filed:
Jun. 22, 1993
James C Chang, Holmdel, NJ (US);
Karim M Ghafouri, Tinton Falls, NJ (US);
Edmond N Hong, Howell, NJ (US);
Christopher Kwan, Marlboro, NJ (US);
Amit Limaye, Piscataway, NJ (US);
Ramesh Sathyanarayana, Ocean Township, Monmouth County, NJ (US);
AT&T Corp., Murray Hill, NJ (US);
Abstract
A method and apparatus for conformance testing of complex entities, such as networks and their protocols. Networks that have their managed objects, attributes and notifications defined in industry standard ASN.1 notation can be methodically processed according to finite state machine models of their managed objects to provide optimum test cases for conformance testing. These test cases are optimum in that they are minimized according to a cost criterion, while designed to test each state of the finite state machine model at least once. A data base stores the optimum test cases of the managed objects to support testing of the defined and modeled network. The method further applies these optimum test cases via a test apparatus to a system-under-test, e.g. a network, to test conformance thereof to its specifications.