The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 1995

Filed:

Jun. 22, 1994
Applicant:
Inventors:

Hiroshi Ohki, Yokohama, JP;

Jun Iwasaki, Yokohama, JP;

Assignee:

Nikon Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J / ; G01B / ;
U.S. Cl.
CPC ...
356300 ; 356346 ; 25022723 ;
Abstract

A waveguide type wavelength measuring apparatus is provided with a single mode channel type optical waveguide formed on a waveguide substrate, in which the light to be measured is inputted, a double mode waveguide connected to the single mode channel type optical waveguide, waveguide branches for branching the light output from the double mode waveguide, and photodetectors for detecting independently the light branched by the waveguide branches. The wavelength of the inputted light is measured on the basis of the output signals from the photodetectors. Hence it is possible to perform precise real-time measurement of the wavelength of the incident light with a compact and extremely miniaturized structure.


Find Patent Forward Citations

Ohki, Hiroshi. (1995). Waveguide type wavelength measuring apparatus (U.S. Patent No. 5416578). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5416578

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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