The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 16, 1995
Filed:
Dec. 22, 1992
Applicant:
Inventor:
Stephen D Fantone, Lynnfield, MA (US);
Assignee:
Optikos Corporation, Cambridge, MA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356124 ;
Abstract
A system for the automatic measurement of parameters of optical elements such as radii of curvature, thickness, power, index of refraction, and focal length including the radii of curvature of convex or concave optical surfaces such as those of lenses, molds, lathe turned optics, inserts, ball bearings or micro-optics. The system includes a computer for control, operator interfacing, and analysis, along with an optical head for providing signals from which parameters can be calculated.