The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 1995

Filed:

Sep. 24, 1993
Applicant:
Inventors:

Minoru Arai, Asaka, JP;

Kiyotaka Kaneko, Asaka, JP;

Takashi Soga, Asaka, JP;

Shigekazu Fukada, Asaka, JP;

Tadashi Fujii, Asaka, JP;

Izumi Miyake, Asaka, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N / ;
U.S. Cl.
CPC ...
348229 ; 348234 ; 348297 ;
Abstract

In a method of and apparatus for split photometry, a plurality of split photometric areas are established by setting a plurality of horizontal and vertical photometric intervals respectively within intervals in a horizontal scanning direction and a vertical scanning direction of the solid-state electronic image sensing device. An extracted luminance-signal component is integrated over a horizontal integration interval designated by an integration control signal. Integrated values obtained by the integration operation are summed, in every split photometric area, over the corresponding vertical photometric interval, and a photometric value is calculated for every split photometric area based upon the value obtained by summing the integrated values in another embodiment, data for controlling exposure or controlling the focusing of an image pick-up lens can be obtained for each of a plurality of blocks set in a photographic area. From data representing the image of a subject, a luminance signal is generated and converted into digital luminance data which is applied to a gate array. The luminance data is summed block by block in the gate array and the summed data is outputted in block units. Only the necessary data is selected from the summed luminance data of every block and a photometric value is calculated. A diaphragm and an electronic shutter is controlled based upon the photometric value calculated. A high-frequency component signal for focusing control can be calculated for each and every block in a similar manner.


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