The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 16, 1995
Filed:
Jun. 28, 1993
John L Waugaman, Perrysburg, OH (US);
Owens-Brockway Glass Container Inc., Toledo, OH (US);
Abstract
A system and method for contact measurement of dimensional parameters of a container in which rollers coupled to LVDT sensors are placed in contact with a container as the container is rotated about its central axis so that the sensors develop analog signals that vary as a function of variations in geometry of the container. The sensor output signals are fed through multiple input channels to an a/d convertor/multiplexer, which is controlled by a central microcontroller for selecting in turn among the plurality of sensor signals. Within the microcontroller, each sensor signal is compared to a threshold indicative of maximum acceptable deviation of the corresponding dimensional parameter, and the container under test is rejected if the parameter exceeds such threshold. The microcontroller includes facility for real-time display of measured parameters in English or metric units at the selection of an operator, and for communication of measurement data to a remote computer.