The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 09, 1995
Filed:
Feb. 03, 1993
Yukio Ikezawa, Tokyo, JP;
Shinichi Kobayashi, Tokyo, JP;
Kabushiki Kaisha Topcon, Tokyo, JP;
Abstract
A lens meter having an optical measuring system which can measure optical characteristics of a progressive lens includes a memory means which stores the optical characteristics of each measuring point measured in a range from a far vision region to a near vision region by the optical measuring system, a distinguishing means which compares the optical characteristics of each measuring point stored in the memory means and distinguishes whether the measured points belong to a progressive band or areas located in both right and left sides of the progressive band, a display means which displays a result of the distinguishing means. With this structure, the optical characteristics of each measuring point can be measured ranging from the far vision region to the near vision region by the optical measuring system, and the results are stored in the memory means. Next, by means of the distinguishing means, the optical characteristics of each measuring point are compared and distinguished whether the measured points belong to the progressive band or the areas located in both right and left sides of the progressive band. This distinguished result is displayed by the display means. Thus, the measuring position of the progressive lens can be easily recognized, and thus the near vision power can be accurately measured.