The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 09, 1995
Filed:
May. 31, 1994
Antoon F Mehlkopf, Eindhoven, NL;
Johannes H Den Boef, Eindhoven, NL;
U.S. Philips Corporation, New York, NY (US);
Abstract
A magnetic resonance imaging method is known for the reduction of image errors in magnetic resonance images which are caused by quantization errors in a DAC (26) for generating a phase encoding gradient waveform in an MRI measuring sequence (ms1, ms2) for generating magnetic resonance signals (S(t), S.sub.1 (t)). The known method has the drawback that inter alia the effect of differential non-linearity of the DAC (26) on the image errors is not taken into account. The invention proposes an MRI method in which such image errors are also reduced. To achieve this, prior to and/or during application of the measuring sequences (ms1, ms2), deviations of phase encoding gradient areas relative to desired areas are determined and image data in an image matrix derived from the resonance signals are corrected on the basis of said deviations.