The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 02, 1995
Filed:
Aug. 12, 1993
John K McGeehan, Woodbury, NJ (US);
Gerhard Ertingshausen, Princeton, NJ (US);
Timothy B Meluch, Bear, DE (US);
ActiMed Laboratories, Inc., Burlington, NJ (US);
Abstract
A quantitative test device is manufactured using a feedback loop which allows one to modify continuously the dimensions of a reading scale printed on the device. The quantitative test device is manufactured by attaching the critical component of a two-component dye system to minute particles such as microcrystalline cellulose, silica, or latex, which particles are suspended in a solution of a polymeric binder. Additional non-immobilized components of the reaction system of the test device are optionally added to the polymer solution. The suspension of dyed particles in polymer solution is applied to a fabric as a coating, using conventional coating machines, to obtain a homogeneous distribution of immobilized dye throughout the fabric. The device includes a measurement zone which is made from a film support made of a material having a lower melting point than the filter cloth fabric used in the measurement zone was used. By using a lower melting point material for the support film, impulse heat sealing is controlled to a degree such that the lower melting point support is made to melt and extrude through the mesh of the fabric on either side of a channel, forming a seal along the sides of the channel.