The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 02, 1995
Filed:
Jun. 18, 1993
George J Esseff, Camarillo, CA (US);
Earl Steiker, Los Angeles, CA (US);
Infra-Temp Inc., Camarillo, CA (US);
Abstract
An improved probe cover and thermometer for tympanic temperature measurement include means to preclude the reuse of a probe cover. In the preferred embodiment, a cup-shaped probe cover includes two or more legs terminating in tabs or flanges. The tabs or flanges are sensed by switches. In the preferred embodiment, the switches are disposed within a recess, thereby precluding the circumvention of the switch function. In an alternative embodiment, a plurality of externally located switches are provided to mate with a plurality of flanges. Alternative, the extension from the probe cover may comprise a skirt terminating in a flange or tab. In operation, the thermometer may not be operated without the positive presence of a probe cover, as indicated by the presence of the tabs acting upon the recessed switch or a plurality of tabs acting upon the externally located switches. Ejection of the probe cover causes deformation of the probe cover to indicate prior use. The preferred modes of deformation include marking, such as with indelible ink, punching, cutting or bending. The tabs or flanges provide a positive locking force of the probe cover to the thermometer until ejection. The deformation of the probe cover upon ejection in combination with the one time temperature measurement ensures that a new probe cover will be utilized with the subsequent measurements.