The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 25, 1995

Filed:

Aug. 27, 1993
Applicant:
Inventors:

Ryusuke Masuoka, Tokyo, JP;

Nobuo Watanabe, Zama, JP;

Takashi Kimoto, Yokohama, JP;

Akira Kawamura, Kawasaki, JP;

Kazuo Asakawa, Kawasaki, JP;

Jun'ichi Tanahashi, Yamato, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
395 23 ;
Abstract

A learning system is used in a data processing apparatus for learning an input pattern by obtaining an internal-state value necessary for realizing a desired data conversion by performing a pattern conversion defined by the internal-state value and calculating an output pattern corresponding to the input pattern. The learning system comprises a pattern presenting unit for presenting an input pattern group of the subject to be learned for pattern conversion, dividing the input pattern group of the subject to be learned into at least two sets, selecting one of the divided sets, presenting the input pattern group of the selected set to a pattern conversion unit and presenting an input pattern group belonging to all the sets presented up to the current point when the internal-state value to be converged is obtained in accordance with the presentation of the selected set, and an error value calculating unit for calculating an error value representing a magnitude of a non-consistency between an output pattern group outputted in accordance with the presentation and a teacher pattern group representing a pattern to be obtained by the said output pattern group.


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