The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 25, 1995
Filed:
Jan. 24, 1994
Yufeng Li, Eden Prairie, MN (US);
Peter R Goglia, Edina, MN (US);
Christopher C Zahn, Minneapolis, MN (US);
Seagate Technology, Inc., Scotts Valley, CA (US);
Abstract
A calibration standard for uniformly calibrating flying height testers. The calibration standard includes a wedge slider held in contact with a glass disc by a load bridge, load spring and cover case. The wedge slider has a first rail and a second rail extending along its length and has a raised end to form an optical wedge between the glass disc and the first and second rails. A profilometer is used to map any surface irregularities on the surfaces of the first and second rails facing the disc, allowing the calculation of an accurate expected distance, or flying height, between the surfaces and the disc at each horizontal location along the length of the wedge slider. The expected flying height is compared to a flying height measured through optical interference techniques to calibrate the flying height tester.