The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 18, 1995
Filed:
May. 21, 1993
Abstract
Process for the reconstruction of three-dimensional images of an object (3), in which the reconstruction is obtained by calculating sums of projections on planes extracted from a conical attenuation radiation traversing the object, or an emission from the object in accordance with a conical collimation. The bidimensional detector array (4) used for this purpose has a random inclination (.xi.) with respect to the rotation axis defining the mark in which the image is reconstructed as a result of a voluntary choice. Formulas are given making it possible to obtain a limited distortion reconstruction after measuring the displacement parameters of the array and the conical radiation beam. The position errors resulting from construction defects are also taken into account in the calculations after measurement. A parameter measurement protocol and the associated calculation process are also described.