The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 18, 1995

Filed:

Mar. 19, 1993
Applicant:
Inventors:

Kosuke Sato, Osaka, JP;

Takayuki Yoshigahara, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356376 ; 250560 ;
Abstract

A distance measuring method and apparatus accurately detects point in time when reflected slit light passes a cell constituting an imaging plane. Each of the cells constituting the imaging plane includes a pair of photo-sensors disposed side by side along the direction of movement of the reflected slit light. A comparator compares photoelectric currents outputted from the pair of photo-sensors, and a point in time at which the reflected slit light moves from a first one to a second one of the photo-sensors of the cell is determined based on the output of the comparator. The point in time thus detected is determined as a point in time at which the reflected slit light passes the cell and is used for measurement of the distance to the subject for measurement.


Find Patent Forward Citations

Sato, Kosuke. (1995). Distance measuring method and apparatus that compares signals from (U.S. Patent No. 5408324). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5408324

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…