The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 18, 1995
Filed:
Aug. 19, 1994
Tomey Corp., Nagoya, JP;
Abstract
A method and apparatus for measuring a refracting power of an optical system to be inspected. A beam source generates a luminous flux which passes through the optical system to be inspected. A rotating plate intermittently blocks the beam after passing through the optical system to be inspected. A beam receiving element receives the beam passing through the optical system to be inspected and intermittently blocked by the rotating plate, and outputs a beam reception signal based on the received beam. A rotational position detector detects a rotational position of the rotating plate and outputs a rotational plate detection signal based on the detected rotational position of the rotating plate. Further, a calculating means calculates the refracting power of the optical system to be inspected based on a change quantity from the detected rotational plate detection signal to the detected beam reception signal.