The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 18, 1995
Filed:
May. 17, 1991
John P Wikswo, Jr, Brentwood, TN (US);
Alan Lauder, Kennett Square, PA (US);
Vanderbilt University, Nashville, TN (US);
E.I. Du Pont de Nemours and Company, Wilmington, DE (US);
Abstract
The surface or internal structure of diamagnetic and paramagnetic materials is imaged by measuring, preferably with a superconducting quantum interference device (SQUID) magnetometer, perturbations to an applied magnetic field resulting from variations in magnetic susceptibility at an array of locations across the object. The array of perturbation measurements is processed to generate a map of local susceptiblities. For implementation of susceptibility tomography, multiple arrays of perturbation signals for a plurality of relative orientations between the object, the field, and the measurement locations are processed to generate values for local susceptibility at selected sites within the object, such as along a selected sectional plane.