The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 18, 1995
Filed:
Jun. 10, 1993
Patrick Gorria, St.Sernin du Bois, FR;
Hafid Jender, Dijon, FR;
Michel Paindavoine, Le Creusot, FR;
Frederic Truchetet, Marmagne, FR;
Pascal Gerard, Montbard, FR;
Phu-An Ngo, Aulnoye, FR;
Valinox, Boulogne-Billancourt, FR;
Abstract
An apparatus and a process for detecting surface defects on moving long metallic products utilizing linear CCD cameras for effecting exposures at successive times t1, t2,t3 . . . Tn. A processing device calculates differences observed for each pixel or assemble of pixels at the successive times and any variations in the differences makes it possible to detect defects and the extent of the defects. The use of thresholds allows for reduction in the background noise and different orientations of the optical axis of the camera permit the detection of different types of defects.