The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 18, 1995
Filed:
Oct. 07, 1993
John W Locke, Tempe, AZ (US);
Motorola, Inc., Schaumburg, IL (US);
Abstract
A method and apparatus for measuring a level of a material in a tank includes providing a stepped frequency microwave signal to an antenna of a transmitter and receiving in the antenna a received signal from a surface of the material at the level to be measured. A measuring signal containing ranging and calibrating signals is processed in even and odd sample sets input to contiguous narrowband filters formed digitally in a processor using DFT and other algorithms to form true in-phase and quadrature outputs. These outputs are combined and further processed using an interpolation algorithm to isolate ranging and calibration frequency components and to accurately measure the distances represented by such components. The calibration distance associated with the calibration frequency component is compared to a known delay line length and any determined error is used to correct the ranging distance associated with the ranging frequency component.