The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 11, 1995

Filed:

Aug. 06, 1993
Applicant:
Inventors:

Theodore F Zehnpfennig, Wayland, MA (US);

Saul A Rappaport, Burlington, MA (US);

Assignee:

Visidyne, Inc., Burlington, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ;
U.S. Cl.
CPC ...
359399 ; 359213 ; 359364 ; 359433 ; 359559 ;
Abstract

A high-resolution synthetic aperture, adaptive optics system includes an imaging system having a plurality of optical elements including at least a primary mirror which is a section of the aperture to be synthesized, and a detector for receiving the radiation collected by the primary mirror; and a device for rotating the primary mirror section through a number of angular positions about the aperture being synthesized to obtain a plurality of component images of an object, at least one from each of the positions; a device for sensing distortion of an incident wavefront; and a device responsive to distortions of the wavefront for locally adjusting at least one of the optical elements to correct distortions in the wavefront.


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