The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 11, 1995
Filed:
Jul. 23, 1993
Applicant:
Inventor:
Robert W Brandstetter, Levittown, NY (US);
Assignee:
Grumman Aerospace Corporation, Bethpage, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356124 ;
Abstract
A process and apparatus for measuring angular distortion in an optical imaging system in order to provide a mapping that completely characterizes the distortion of the imaging system involves electronically capturing the image of a test pattern at the image plane of the imaging system, superposing a computer generated reference pattern on the test pattern, and measuring the deviation of the test pattern from the reference pattern at selected areas of the reference pattern.