The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 11, 1995

Filed:

Aug. 10, 1992
Applicant:
Inventors:

Chang-Hyun Oh, Franklin Lakes, NJ (US);

Sadek K Hilal, Englewood Cliffs, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V / ;
U.S. Cl.
CPC ...
324309 ; 324307 ;
Abstract

An optimized multislice data acquisition method and apparatus for magnetic resonance imaging is disclosed. In this new method, instead of forming a set of multislice image sequences in series for a given phase encoding step, initiation sequences corresponding to different slices are interwoven with acquisition sequences in an optimal way depending on the desired initiation sequence time. A number of acquisition and initiation sequences are inserted with different slice combinations, between the initiation sequence and acquisition sequence, i.e., long initiation sequence time is effectively utilized for the other slice data acquisition. With this optimized method, imaging time can be reduced by as much as a factor of four compared to existing methods.


Find Patent Forward Citations

Oh, Chang-Hyun. (1995). Methods of multislice acquisition for magnetic resonance imaging (U.S. Patent No. 5406203). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5406203

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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